Material Analyzers
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Contact us:

208-899-4425
Find Your Solution by Product Groups or Industry / Application
SEM/EDX
Scanning Electron Microscopy
Imaging - Mapping - Elemental Analysis
AFA/MQA
Automated Feature Analysis
Particles - Minerals - Metal Inclusions
AQC
Advanced Quality Control
Contaminants - Wear Metals - Filter Analysis
XRF
Laboratory X-Ray Fluoresence
Bulk Material Elemental Analysis
uXRF
Micro-Spot X-Ray Fluoresence
Multi-Layer Coating Thickness & RoHS
pXRF
Portable X-Ray Fluoresence
Handheld or Bench-Top
 
Rheometry and Viscometry
Research and Quality Control
 
Extrusion Processing and Mixing
Laboratory or Pilot Scale
 
Metals Production and Fabrication
Foundries - Scrap - Construction
 
Aerospace and Defense
Metals - Fluids - Composites - Energetics
 
Minerals and Mining
Mineral Liberation - Elemental Analysis
 
Petroleum and PetroChemicals
Sulfur - Metals - Lubricants
 
Pharmaceuticals and Medical
Formulation - Processing - Medical Devices
 
Plastics, Polymer and Rubber
Formulation - Processing
 
Consumer Products
Toxic Contaminants - Failure Analysis
 
Electronics and IT Products
RoHS - REACH - Metal Plating
 
Energy and Power Generation
Metals - Lubrication - Solar - Fuel Cells
 
Nano-Composites
Compounding - Dispersion
 
Environmetal
soils - monitoring - reclamation
 
Inks and Coatings
Surface Analysis - Flow - Thickness
 
Wood and Composites
Pressure Treated Wood - Adhesives
Solutions for ASTM and other standard test procedures:

Metal Quality Analysis and Inclusion Analysis - ASTM E2142, E45, ISO 4967, DIN 50602, EN 10247
ASPEX eXpress and ASPEX eXplorer



Typical Product Names that we offer alternate or replacement solutions for:

ASPEX SEM/EDS and Automated Feature or Particle Analysis systems (eXpress, eXplorer, eXtreme):
for Scanning Electron Microscopy users of Hitachi TM-3000, TM-1000; JEOL NeoScope; FEI Phenom, Helios, Quanta, Inspect, Nova
NanoSEM; Evex Mini-SEM, NanoAnalysis; Oxford Inca, Imax; EDAX; Carl Zeiss

ASPEX Automated solftware solutions for Analysis of Particles, Inclusions, Filters, Mineralogy and Gun Shot Residue:
for users of Olympus Automated Filter Analysis systems; Leica, FEI QEMscan, FEI MLA Mineral Liberation Analyzer; Bruker Quantax

Rigaku Lab XRF systems (NexCG, NexQC):
for users of Oxford QX, ED-2000, Twin-X, X-Supreme, LabX; Spectro Phoenix, Xepos, Titan; Bruker S2 Ranger, S2 PicoFox, S4 Explorer,
S4 Pioneer, S8 Tiger; Thermo ARL AdvantX, OptimX; Horiba SLFA; SkyRay EDX2800; PANalytical Axious, Minipal, Epsilon, Venus;
Rigaku Mini-Z, ZXS Primus, SuperMini, Primini; XOS Sindie, Clora; Asoma; Niton XL3t 900, XLt3 800, XLt 898, GOLDD, XL3p, XLp, XLt,
XLi; Innov-X Delta, Alpha, Xpress, Omega; Spectro xSort; SkyRay; Bruker Sorter, TurboSD, Tracer

Oxford MicroSpot XRF systems (CMI-900 and X-Strata980):
for users of Fischer XDL, XDAL; Bruker M1 Mistral, M1 Ora, M4 Tornado; Horiba XGT; Spectro Midex

Mobile LIBS systems
for users of Oxford ArcMet8000, PMI-Master Pro, TestMaster Pro, ArcMet930; Spectro iSort, SpectroTest, SpectroSort; Arun MetalScan;
RMG MiniSort

Lab LIBS systems:
Spectro SpectroMAXx, SpectroLAB; Thermo ARL 3460, Quantrix, QuantroDesk, 4460; Arun Polyspek; Bruker

Haake Viscometers (VT5, VT6, VT550, RV1)
for users of Haake RV20, RV100; RS150, RS600; Brookfield DV-I, DV-II+, CAP-1000, CAP-2000, DV-III, R/S

Haake Rheometers (RS1, RS6000, MARS, RheoScope):
for users of Haake RV1, RS1, RS100, RS150, RS600; TA Instruments AR1000, AR2000, AR-G2, ARES-G2; Bohlin Malvern Kinexus, VOR,
CVO, Gemini; ATS Rheosystems Rheologica Nova, Dynalyser, Viscotech; Anton Paar Physica MCR; Rheometrics RDS, DSR, RSA, ARES;
Carrimed CSL

Haake MiniLab and MiniJet Compounders:
for users of DSM Xplore; DACA MicroCompounder;

Haake Polylab Torque Rheometers:
for users of Haake Rheocord; CW Brabender LabStation, Plasticorder, Intell-torque
Companies represented:

ASPEX - Automated SEM Particle Analysis








Applied Rigaku Technologies - XRF Analyzers








Thermo Scientific - Materials Characterization
About Us
Western Analytical Solutions, LLC
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