Material Analyzers

Contact us:

208-899-4425
or
Find Your Solution by Product Groups or Industry / Application
XRF
Laboratory X-Ray Fluoresence
Fast and Accurate Elemental Analysis
SEM
Scanning Electron Microscopy
Imaging - Mapping - Elemental Analysis
EDS (EDX)
Energy Dispersive X-Ray Spectroscopy
Fully Integrated for High Speed Automated SEM
AFA
Automated Feature Analysis
Particles - Mineralogy - Gun Shot Residue (GSR)
MQA
Metal Quality Analyzers
Inclusions - Composition - Failure Analysis
AQC
Advanced Quality Control
Contaminants - Wear Metals - Foreign Particles
LIBS
Laser Induced Breakdown Spectroscopy
Optical Emission Elemental Analysis
LA-ICP-MS
Laser Ablation ICP-MS
Femto and Nano Second Laser Ablation
Metals Production and Fabrication
Foundries - Precious Metals
Aerospace and Defense
Metals - Fluids - Composites - Energetics
Minerals and Mining
Mineral Liberation - Elemental Analysis
Petroleum and PetroChemicals
Sulfur - Metals - Lubricants
Pharmaceuticals and Medical
Formulation - Processing - Medical Devices
Plastics, Polymer and Rubber
Inorganic Fillers - Contaminants
Consumer Products
Toxic Contaminants - Failure Analysis
Electronics and IT Products
RoHS - REACH - Metal Plating
Energy and Power Generation
Lubrication - WInd - Solar - Fuel Cells
Environmental
soils - ambient air monitoring
Forensics
Gun Shot Residue - Trace Evidence
Solutions for ASTM and other standard test procedures:

Metal Quality Analysis and Inclusion Analysis - ASTM E2142, E45, ISO 4967, DIN 50602, EN 10247
ASPEX eXpress and ASPEX eXplorer



Typical Product Names that we offer alternate or replacement solutions for:

ASPEX SEM/EDS and Automated Feature or Particle Analysis systems (eXpress, eXplorer, eXtreme):
for Scanning Electron Microscopy users of Hitachi TM-3000, TM-1000; JEOL NeoScope; FEI Phenom, Helios, Quanta, Inspect, Nova
NanoSEM; Evex Mini-SEM, NanoAnalysis; Oxford Inca, Imax; EDAX; Carl Zeiss

ASPEX Automated solftware solutions for Analysis of Particles, Inclusions, Filters, Mineralogy and Gun Shot Residue:
for users of Olympus Automated Filter Analysis systems; Leica, FEI QEMscan, FEI MLA Mineral Liberation Analyzer; Bruker Quantax

Rigaku Lab XRF systems (NexCG, NexQC):
for users of Oxford QX, ED-2000, Twin-X, X-Supreme, LabX; Spectro Phoenix, Xepos, Titan; Bruker S2 Ranger, S2 PicoFox, S4 Explorer,
S4 Pioneer, S8 Tiger; Thermo ARL AdvantX, OptimX; Horiba SLFA; SkyRay EDX2800; PANalytical Axious, Minipal, Epsilon, Venus;
Rigaku Mini-Z, ZXS Primus, SuperMini, Primini; XOS Sindie, Clora; Asoma; Niton XL3t 900, XLt3 800, XLt 898, GOLDD, XL3p, XLp, XLt,
XLi; Innov-X Delta, Alpha, Xpress, Omega; Spectro xSort; SkyRay; Bruker Sorter, TurboSD, Tracer

MicroSpot XRF systems:
for users of  Oxford (CMI-900 and X-Strata980); Fischer XDL, XDAL; Bruker M1 Mistral, M1 Ora, M4 Tornado; Horiba XGT; Spectro Midex

Mobile LIBS systems
for users of Oxford ArcMet8000, PMI-Master Pro, TestMaster Pro, ArcMet930; Spectro iSort, SpectroTest, SpectroSort; Arun MetalScan;
RMG MiniSort


Lab LIBS systems:
for users of Spectro SpectroMAXx, SpectroLAB; Thermo ARL 3460, Quantrix, QuantroDesk, 4460; Arun Polyspek; Bruker
Companies represented:

ASPEX (an FEI Company) - SEM Particle Analysis








Applied Rigaku Technologies - XRF Analyzers







Applied Spectra - Laser Ablation Spectroscopy
About Us
Western Analytical Solutions, LLC
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We offer Analytical
Instrumentation and
Solutions for Materials
Science Research and
Quality Control for a
variety of Applications
and Industries.  If you
have trouble locating
what you need, please
contact us and we will
gladly assist you in
finding a good solution.