Oxford CMI-165/563 Portable Copper Thickness Gauge
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The CMI-165 and CMI-563 provide surface Copper thickness measurements
especially for the quality control needs of the Printed Circuit Board industry.
Measurements on Copper are affected by the temperature of the sample.
The CMI-165 accounts for temperature in the measurement of thickness
ensuring accurate in-process inspection results regardless of Copper
temperature.
Both probes utilize Oxford Instruments proprietary micro-resistance
technology featuring economical, user-replaceable measurement tips.
In addition, the CMI-511 is similar to the 563 but specifically designed for
plated thru-hole (PTH)
especially for the quality control needs of the Printed Circuit Board industry.
Measurements on Copper are affected by the temperature of the sample.
The CMI-165 accounts for temperature in the measurement of thickness
ensuring accurate in-process inspection results regardless of Copper
temperature.
Both probes utilize Oxford Instruments proprietary micro-resistance
technology featuring economical, user-replaceable measurement tips.
In addition, the CMI-511 is similar to the 563 but specifically designed for
plated thru-hole (PTH)
Western Analytical Solutions, LLC
Material Analyzers
- Measure the thickness of copper foil on rigid, flexible, single- and double-sided,
or multi-layer PCB's - Measure foil or laminated copper thickness in mils or µm
- Sort copper by weight at incoming inspection, before drilling, shearing or
plating - Determine electro-less or electroplated Cu thickness on PCB's
- Accurately quantify copper thickness after etching or planarizing
- Verify copper plating thickness on PCB surface
CMI-165 Standard Features:
- SRP-T1 Replaceable Probe Tip - no recalibration necessary
- Spare SRP-T1 ensures no factory downtime
- Illuminated probe tip for easy positioning on copper traces
- User Interface available in both English and Simplified Chinese
- Measure etched traces as thin as 204 μm (8mils) without line width standards
- Store 9,690 measurements (with optional date and time stamp)
- USB 2.0 high-speed data transfer interfaced with Microsoft ExcelTM
- Factory calibrated and certified
- Static or continuous mode measurement
- Instrument is a single-button handheld device powered by a AA battery
CMI-563 Standard Features:
- Rugged hand-held 16-button unit featuring a large 4-digit LCD display,
powered by single 9V battery - Features Oxford Instruments proprietary, economical, user-replaceable SRP-4
probe tips that can be easily replaced on site minimizing downtime - Contains fine-line measurement algorithm for measuring on Cu traces
- RS-232 serial port output for a printer or PC download
- Statistical data analysis and reporting with memory location, number of
readings, Cu type, date-time stamping, mean, standard deviation, accuracy,
high, low, range, and histogram
Use this button to request information on
pricing, performance data and technical
notes on specific applications of interest:
DOWNLOADS:
CMI-165 Brochure (PDF)
CMI-563 Brochure (PDF)
CMI-511 Brochure (PDF)
Probe Specifications
Link to Manufacturers Web Page (165)
Link to Manufacturers Web Page (563)
pricing, performance data and technical
notes on specific applications of interest:
DOWNLOADS:
CMI-165 Brochure (PDF)
CMI-563 Brochure (PDF)
CMI-511 Brochure (PDF)
Probe Specifications
Link to Manufacturers Web Page (165)
Link to Manufacturers Web Page (563)
| CMI-563 |
| CMI-165 |
