Oxford XMet5000 & XMet5100 Portable XRF Metals Analyzer
Oxford Instruments offers two models of its popular portable
XRF for Metals Identification and Composition Analysis.
- XMet5000 with Si-PIN detector for elements Ca to U
- XMet5100 with SDD detector for elements Mg to U
The XMet is the best balanced and most ergonomic handheld
XRF on the market with the smallest nose to get into the
tightest measurement locations.
The results display is unique in that it displays the 2 closest
matched grade's specification limits and identifies any elements
outside the limits with different high or low color hightlights.
The same analyzer can also be used for testing Plastics,
Minerals, Soils, Electronics and more with additional optional
calibrations.
Western Analytical Solutions, LLC
Material Analyzers
Both models come with NIST traceable Empirical Calibrations as well as Fundamental
Parameters (FP) to enable accurate dependable analysis. These rugged and reliable
portable XRF analyzers are IP54 (NEMA 3) approved for superior dust and splash
extended productivity without returning to base.
The X-MET5000 offers routine identification performed in seconds, 304/321 separation or
Grade 7/CPTi in less than 5 seconds. X-MET has an integrated heat shield which allows
the measurement of surfaces up to 400°C / 750°F for extended periods. It can make
analyses from narrow weld seams down to 2 mm.
The X-MET5100 hand-held XRF analyser assures rapid, on-site laboratory quality chemical
analysis of Aluminium and Titanium alloys, as well as Copper, Nickel and Ferrous alloys
and can reliably analyse Light Elements such as Al, Si and Mg without the need for helium
tanks or vacuum pump attachments. Powerful Light Element capability combined with
high performance components provide best-in-class detection limits and measuring speed
for light elements in metals to fully grade Aluminum and Titanium alloys, as well as fast
identification of alloys like Stainless 303 vs 304 (having difference of sulfur content).
X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with
a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster
measurement speed, much better detection limits and a significant accuracy improvement
over conventional Si-PIN detector based systems.
Fast Grade ID - even Aluminium! --- Fastest scrap sorting!
- 1-second, non-destructive PMI & quality control!!
- Reliable Al, Mg & Si: no vacuum or helium needed (5100)
- Vast alloy library with grade-ID and Chemistry
- Test gold and other precious metals accurately to below 0.1%
- Fast Cr, Ni, Mo, and Cu at low concentrations
- Withstands all weather conditions
- Robust: IP54 certified splash and dust proof
- Long battery operating time