Oxford X-Strata980 Bench-Top XRF Thickness Analyzer
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The X-Strata980 has been designed to improve your
process and quality control with its outstanding precision,
accuracy, and long-term stability.
Fast and precise analysis with high sensitivity is provided
with Oxford Instruments’ 100W X-ray tube and user
friendly software. Simple identification and differentiation
of elements is attained with a high resolution, peltier-
cooled silicon PIN detector. All together providing
optimized performance across a wide range of elements.
Measure samples both large (24"x 29"x 8") and as small
as 150 μm in size using variable spot size. Its low limits
of detection, even in matrices such as plastics allows
RoHS and CPSC compliance testing of finished products.
Additional features include an simple to program X-Y table
to perform area scans, multiple point measurements, and
mapping using point-and-click or pattern input with
orientation compensation such that sample fixtures are
not required. The system can also be used for plating
solution analysis, alloy and compositional analysis, and
more.
process and quality control with its outstanding precision,
accuracy, and long-term stability.
Fast and precise analysis with high sensitivity is provided
with Oxford Instruments’ 100W X-ray tube and user
friendly software. Simple identification and differentiation
of elements is attained with a high resolution, peltier-
cooled silicon PIN detector. All together providing
optimized performance across a wide range of elements.
Measure samples both large (24"x 29"x 8") and as small
as 150 μm in size using variable spot size. Its low limits
of detection, even in matrices such as plastics allows
RoHS and CPSC compliance testing of finished products.
Additional features include an simple to program X-Y table
to perform area scans, multiple point measurements, and
mapping using point-and-click or pattern input with
orientation compensation such that sample fixtures are
not required. The system can also be used for plating
solution analysis, alloy and compositional analysis, and
more.
Western Analytical Solutions, LLC
Material Analyzers
When no standards are available, standard-less (fundamental parameters – FP)
analysis provides simplicity of setting up reliable quantitative results, while covering a
wide range of thicknesses and concentrations. When standards are available, Empirical
calibrations provide the best accuracy. Only a few standards are necessary (typically 1
to 3). Methods are created in minutes. Oxford Instruments supplies certified standards
for best accuracy (A2LA and ISO/IEC 17025 accredited).
Electronics and Circuit Board Manufacturing
Metal Finishing
High Reliability and RoHS / WEEE / REACH Compliance Testing
Metals Alloy Composition and Identification
Solar panels and fuel cells
analysis provides simplicity of setting up reliable quantitative results, while covering a
wide range of thicknesses and concentrations. When standards are available, Empirical
calibrations provide the best accuracy. Only a few standards are necessary (typically 1
to 3). Methods are created in minutes. Oxford Instruments supplies certified standards
for best accuracy (A2LA and ISO/IEC 17025 accredited).
Electronics and Circuit Board Manufacturing
- Component reliability and quality assurance
- Simultaneous solder alloy composition and thickness measurement
- Analysis of gold and palladium thickness of electrical contacts
- Coating thickness of NiP layer on computer hard disc
- Analysis of very thin coatings (e.g. Au/Pd coatings of < 0.1 μm)
Metal Finishing
- Minimise production cost of the plating process and maximise production output
- Simultaneous single or multi elements coating thickness analysis and composition
- Analysis of up to 4 layers (plus substrate)
- Plating bath solution analysis
- Unique calibrations for light element coating like diamond, aluminum, etc
High Reliability and RoHS / WEEE / REACH Compliance Testing
- Improve quality control to ensure products meet specifications
- Determination of hazardous substances from parts per million to high percent
levels - Quantification of toxic elements such as Cd, Hg, Pb and more to verify compliance
Metals Alloy Composition and Identification
- Rapid, non-destructive analysis of jewellery and other alloys
- Precious metal alloy assay - Karat analysis
- Material identification
- Quantification of impurities
Solar panels and fuel cells
- Composition and thicknes analysis of the thin-film absorber layer in thin-film
photovoltaic cells (CIGS, CdTe, etc) - Optimize electrical conductivity through layer thickness analysis
Use this button to request information on
pricing, performance data and technical
notes on specific applications of interest:
DOWNLOADS:
X-Strata980 Brochure (PDF)
X-Strata980 Jewelry Flyer (PDF)
Link to Manufacturers Web Page
pricing, performance data and technical
notes on specific applications of interest:
DOWNLOADS:
X-Strata980 Brochure (PDF)
X-Strata980 Jewelry Flyer (PDF)
Link to Manufacturers Web Page
